The XeN(SO2F)2 + and F[XeN(SO2F)2]2 + Cations: Syntheses, Raman and Multinuclear Magnetic Resonance Studies of the AsF6 and Sb3F16 Compounds, and X-ray Structure of XeN(SO2F)2 +Sb3F16-

Romolo Faggiani, Dietmar K. Kennepohl, Colin J. Lock, Gary J. Schrobilgen

Research output: Contribution to journalJournal Articlepeer-review

72 Citations (Scopus)

Abstract

Like its XeF2 precursor, the Xe-N-bonded FXeN(SO2F)2molecule exhibits fluoride ion donor properties that, in the present work, have resulted in the syntheses of adducts having the stoichiometries FXeN(SO2F)2.AsF5, FXeN(SO2F)2-3SbF5, and 2FXeN-(SO2F)2*AsF5. All compounds have been enriched to 30% with 15N and studied by 15N, 19F, and 129Xe NMR spectroscopy and Raman spectroscopy. The spectroscopic studies have shown the above stoichiometries to be consistent with the predominantly ionic formulations XeN(SO2F)2 +AsF6“, XeN(SO2F)2 +Sb3F16 -, and F[XeN(SO2F)2]2 +AsF6 -. In general, the cations are thermally less stable than their fluorine analogues, XeF+and Xe2F3 +. The crystal structure of XeN(SO2F)2 +Sb3F16~ has been obtained at -64 °C from three-dimensional X-ray data. [Bis(fluorosulfuryl)amido]xenon(II) hexadecafluorotriantimonate(V) crystallizes in the monoclinic system, space group P21/c, with four molecules in a unit cell of dimensions a = 10, 320 (2) Å, b = 10.642 (2) Å, c = 18.167 (3) Å, and β = 108, 94 (1)°. The structure was solved by the heavy-atom method and refined by least-squares and Fourier methods to a final R factor of 0.061 for 2376 observed (F > 0) reflections. The structure analysis has established the existence of discrete XeN(SO2F)2 +Sb3F16“ molecules and shows that the XeN(SO2F)2 +cation is Xe-N bonded and that the Xe-N bond (2.02 (1) Å) is significantly shorter than in FXeN(SO2F)2 (2, 200 (3) A). The Sb3FI6” anion is cis-fluorine bridged and weakly covalently bonded by means of a fluorine bridge to the XeN(SO2F)2 +cation (Xe---F = 2.457 (8) Å).

Original languageEnglish
Pages (from-to)563-571
Number of pages9
JournalInorganic Chemistry
Volume25
Issue number4
DOIs
Publication statusPublished - 1 Feb. 1986

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